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then defining MPCT performance as a function of IPS performance
Originally published October 2000
The scope of this Standard is limited to the communication interface used to integrate equipment within factory automation systems
This Test Method applies to all type of high purity gas delivery systems used in semiconductor manufacturing facilities and comparable research and development areas
This Standard does not require
G06200 - SEMI G62 - Test Method for Silver Plating Quality StdPbc-0618 then defining MPCT performance asThis Test Method describes procedures to determine silver plating quality. These methods apply to silver plating on leadframes for plastic packages. Applicable plating styles are listed in Table 1. Referenced SEMI StandardsSEMI G55 Test Method for Measurement of Silver Plating Brightness SEMI G56 Test Method for Measurement of Silver Plating Thickness
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